Advanced Manufacturing, Electronics and Microsystems: TechConnect Briefs 2015Advanced Manufacturing, Electronics and Microsystems TechConnect Briefs 2015

Modeling & Simulation of Microsystems Chapter 7

Time-Domain Monte-Carlo and Noise Analysis of MAPS Sensors

M. Jankowski, A. Napieralski
Lodz University of Technology, Poland

pp. 262 - 265

Keywords: MAPS, sensors, Monte Carlo, noise, transient, analysis

A non-typical approach to extended simulational analysis for monolithic active pixel (MAPS) based binary pixel readout circuits is presented. Circuit solutions and simulation results are presented and discussed. Applications of particle detection/tracking are quite wide, in general. Rolling-shutter Binary Readout circuit, shaperless Front End (SFE) active pixel and reduced Pitch Ampli-Shaper-Discriminator block existing solutions were selected and tested. Unpredicted phenomenon in the first of listed circuits under simulation is detected, its cause tracked down and removed. Conveniently (and luckily for a designer), the problem is found to be manageable solely by means of control signal sequence modifications, with no hardware alterations required. The circuit in consideration is a switched-power solution. Thus, typical frequency domain AC simulations usually employed for assessment of noise performance are not enough, as they represent small signal approach and thus do not cover all stages and details of such switching circuit operation. Presented time-domain simulation approach, though time consuming, may save design and whole project flow long delays, additional redesign, fabrication and test iteration as large part of identified problems might be found unable to be solved without hardware re-design and circuit re-fabrication and additional financial consequences.