Advanced Materials: TechConnect Briefs 2015Advanced Materials TechConnect Briefs 2015

Nanoscale Materials Characterization Chapter 1

Understanding 2D atomically thin and layered materials beyond graphene using a novel X-ray microscope

J. Avila, C. Chen, S. Lorcy, M.C. Asensio
Synchrotron SOLEIL, France

pp. 43 - 46

Keywords: chemical microscopy, mesoscopic materials, electronic structure

Research and development of atomically thin, 2D materials from a broad range of layered compounds beyond graphene have sparked enormous scientific interest. The main goal in this field is to disclose the implication of heterogeneities and confinement on the delocalized or partially localized electronic states. For such aim, the description of the electronic structure must be complete, not only with regard to the lateral detection of core levels and their chemical shifts, but also recording those states typically present close to the Fermi level. This objective is rather pertinent as those electronic states are directly responsible for the chemical bonds, reactivity, electrical transport as well as the thermal, magnetic and mechanical properties of matter. This knowledge is acquired currently in an academic context, usually in basic research studies. In order to fill this need, we have recently developed a novel X-ray microscope, labelled, nanoARPES (Nano Angle Resolved Photoelectron Spectroscopy), particularly well-suited to provide valuable spectroscopic and electronic information in the real and reciprocal space of mesoscopic samples. It is a cutting-edge technique able determining the momentum and spatial resolved electronic structure of advances materials at the nano- and meso-scale. In this presentation, the more relevant results of the recently built ANTARES microscope will be disclosed.